F. Stella
Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules
Stella, F.; Olanrewaju, O.; Yang, Z.; Castellazzi, A.; Pellegrino, G.
Authors
O. Olanrewaju
Z. Yang
A. Castellazzi
G. Pellegrino
Abstract
© 2018 Elsevier Ltd The ability to monitor temperature variations during the actual operation of power modules is key to reliability investigations and the development of lifetime prediction strategies. This paper proposes an original solution, specifically devised with novel fast-switching silicon carbide (SiC) power MOSFETs in mind. The results show ability to track temperature variations resulting from active power cycling of the devices, including high speed transients, thus enabling to discriminate among different potential failure mechanisms. Validation of the proposed methodology and its accuracy is carried out with the support of infrared thermography.
Citation
Stella, F., Olanrewaju, O., Yang, Z., Castellazzi, A., & Pellegrino, G. (2018). Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules. Microelectronics Reliability, 88-90, 615-619. https://doi.org/10.1016/j.microrel.2018.07.072
Journal Article Type | Article |
---|---|
Acceptance Date | Jul 6, 2018 |
Online Publication Date | Sep 30, 2018 |
Publication Date | Sep 1, 2018 |
Deposit Date | Nov 14, 2018 |
Publicly Available Date | Sep 2, 2019 |
Journal | Microelectronics Reliability |
Print ISSN | 0026-2714 |
Publisher | Elsevier |
Peer Reviewed | Peer Reviewed |
Volume | 88-90 |
Pages | 615-619 |
DOI | https://doi.org/10.1016/j.microrel.2018.07.072 |
Keywords | SiC power MOSFET; On-state voltage; Active thermal control; Junction temperature monitoring; Infrared thermography |
Public URL | https://nottingham-repository.worktribe.com/output/1256460 |
Additional Information | This article is maintained by: Elsevier; Article Title: Experimentally validated methodology for real-time temperature cycle tracking in SiC power modules; Journal Title: Microelectronics Reliability; CrossRef DOI link to publisher maintained version: https://doi.org/10.1016/j.microrel.2018.07.072; Content Type: article; Copyright: © 2018 Elsevier Ltd. All rights reserved. |
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