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Scanning Probe Microscopy, Applications

Roberts, C.J.; Davies, M.C.; Tendler, S.J.B; Williams, P.M.


C.J. Roberts

M.C. Davies

S.J.B Tendler

Professor of Biophysics



The family of scanning probe microscopes (SPMs) have revolutionary imaging capabilities on a range of materials. For example, atomic resolution images of metal and semiconductor surfaces produced by the scanning tunnelling microscope (STM) or images of individual biomolecules in aqueous environments recorded by atomic force microscopy (AFM) are now routine in the literature. Perhaps, less well known, is the even greater potential of these and other probe-based techniques to produce spatially resolved spectroscopic information at the atomic or molecular level. Following a brief introduction to the principal SPMs available, this article will review as comprehensively as possible the wide ranging applications of spectroscopic SPM in semiconductor, material and life sciences.


Roberts, C., Davies, M., Tendler, S., & Williams, P. (2017). Scanning Probe Microscopy, Applications. In Encyclopedia of spectroscopy and spectrometry (15-22). (3rd edition). Cham: Elsevier.

Acceptance Date Oct 10, 2016
Online Publication Date Oct 10, 2016
Publication Date 2017
Deposit Date Nov 2, 2018
Publisher Elsevier
Pages 15-22
Edition 3rd edition
Book Title Encyclopedia of spectroscopy and spectrometry
Chapter Number 2
ISBN 9780128032244
Keywords Atomic force microscopy; DNA; Fluorescence; Intermolecular forces; Metals; Near-field Scanning optical microscope; Polymers; Proteins; Scanning tunneling microscopy; Semiconductors; Superconductors
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