Scanning Probe Microscopy, Applications

Roberts, C.J.; Davies, M.C.; Tendler, S.J.B; Williams, P.M.

Abstract

The family of scanning probe microscopes (SPMs) have revolutionary imaging capabilities on a range of materials. For example, atomic resolution images of metal and semiconductor surfaces produced by the scanning tunnelling microscope (STM) or images of individual biomolecules in aqueous environments recorded by atomic force microscopy (AFM) are now routine in the literature. Perhaps, less well known, is the even greater potential of these and other probe-based techniques to produce spatially resolved spectroscopic information at the atomic or molecular level. Following a brief introduction to the principal SPMs available, this article will review as comprehensively as possible the wide ranging applications of spectroscopic SPM in semiconductor, material and life sciences.

Citation

Roberts, C., Davies, M., Tendler, S., & Williams, P. (2017). Scanning Probe Microscopy, Applications. In Encyclopedia of spectroscopy and spectrometry (15-22). (3rd edition). Cham: Elsevier. https://doi.org/10.1016/B978-0-12-803224-4.00275-2

• Acceptance Date: Oct 10, 2016
• Online Publication Date: Oct 10, 2016
• Publication Date: 2017
• Deposit Date: Nov 2, 2018
• Publisher: Elsevier
• Pages: 15-22
• Edition: 3rd edition
• Book Title: Encyclopedia of spectroscopy and spectrometry
• Chapter Number: 2
• ISBN: 9780128032244
• DOI: https://doi.org/10.1016/B978-0-12-803224-4.00275-2
• Keywords: Atomic force microscopy; DNA; Fluorescence; Intermolecular forces; Metals; Near-field Scanning optical microscope; Polymers; Proteins; Scanning tunneling microscopy; Semiconductors; Superconductors
• Public URL: https://nottingham-repository.worktribe.com/output/1219314
• Publisher URL: https://www.sciencedirect.com/science/article/pii/B9780128032244002752?via%3Dihub