CHRISTOPHER SMARTT CHRIS.SMARTT@NOTTINGHAM.AC.UK
Research Fellow
EMC-oriented multi-conductor equivalent circuit cable models for spice, including transfer impedance coupling and incident field excitation
Smartt, Christopher; Basford, Michael; Greedy, Steve; Thomas, David; Sumner, Mark
Authors
Michael Basford
STEVE GREEDY STEVE.GREEDY@NOTTINGHAM.AC.UK
Associate Professor
David Thomas
MARK SUMNER MARK.SUMNER@NOTTINGHAM.AC.UK
Professor of Electrical Energy Systems
Abstract
This paper describes the development and application of sophisticated multi-conductor cable bundle models for Spice simulation. The cable models developed include frequency dependent parameters, transfer impedance coupling and incident plane wave excitation. The models may be used in frequency domain or transient simulations and are intended for EMC/ EMI studies. Simulations of realistic scenarios are presented to demonstrate typical applications.
Citation
Smartt, C., Basford, M., Greedy, S., Thomas, D., & Sumner, M. (2017). EMC-oriented multi-conductor equivalent circuit cable models for spice, including transfer impedance coupling and incident field excitation. In Proceedings of the 2017 19th International Conference on Electromagnetics in Advanced Applications (1283-1287). https://doi.org/10.1109/ICEAA.2017.8065507
Conference Name | 2017 International Conference on Electromagnetics in Advanced Applications (ICEAA) |
---|---|
Conference Location | Verona, Italy |
Start Date | Sep 11, 2017 |
End Date | Sep 15, 2017 |
Acceptance Date | Sep 11, 2017 |
Online Publication Date | Oct 12, 2017 |
Publication Date | Sep 11, 2017 |
Deposit Date | Nov 21, 2018 |
Publicly Available Date | Mar 29, 2024 |
Publisher | Institute of Electrical and Electronics Engineers |
Pages | 1283-1287 |
Book Title | Proceedings of the 2017 19th International Conference on Electromagnetics in Advanced Applications |
ISBN | 978-1-5090-4452-8 |
DOI | https://doi.org/10.1109/ICEAA.2017.8065507 |
Public URL | https://nottingham-repository.worktribe.com/output/1217575 |
Publisher URL | https://ieeexplore.ieee.org/document/8065507 |
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