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The application of tripod polishing and focused ion beam milling to the TEM specimen preparation of HVOF thermally sprayed coatings

Kong, Gaoning; McCartney, D. Graham; Brown, Paul D.

Authors

Gaoning Kong

D. Graham McCartney

Paul D. Brown



Contributors

Stephen McVitie
Editor

David McComb
Editor

Abstract

The microstructure of high velocity oxy fuel thermally sprayed coatings is highly anisotropic and inhomogeneous. Tripod polishing has enabled the preparation of samples with up to 0.5mm diameter electron transparent areas, where a statistically significant number of features could be examined. Conversely, FIB has been used to prepare TEM samples for site-specific analysis of sub-micron regions of interest, e.g. for the interface characterisation between metallic coatings and the substrate, or the study of secondary precipitation on pre-existing phases in cermet coatings.

Citation

Kong, G., McCartney, D. G., & Brown, P. D. (2004). The application of tripod polishing and focused ion beam milling to the TEM specimen preparation of HVOF thermally sprayed coatings. In S. McVitie, & D. McComb (Eds.), Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics Publishing

Publication Date Jan 1, 2004
Deposit Date Mar 25, 2011
Publicly Available Date Mar 28, 2024
Electronic ISSN 0951-3248
Peer Reviewed Peer Reviewed
Issue 179
Series Title Institute of Physics conference series
Book Title Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003
ISBN 750309679
Keywords TEM; Stellite6; FIB; Tripod polishing; HVOF
Public URL https://nottingham-repository.worktribe.com/output/1021606
Related Public URLs http://iopscience.iop.org/

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