Kong, G., McCartney, D. G., & Brown, P. D. (2004). The application of tripod polishing and focused ion beam milling to the TEM specimen preparation of HVOF thermally sprayed coatings. In S. McVitie, & D. McComb (Eds.), Electron microscopy and analysis 2003: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Oxford, 3-5 September 2003. Institute of Physics Publishing